Agilent Unveils LTE Test Solution

Dec. 6, 2007
Agilent Technologies has announced a new modulation analysis option for its 89600 Series Vector Signal Analysis (VSA) software, aimed at evaluation of 3GPP Long Term Evolution (LTE) wireless systems and their components. Developed for testing and ...

Agilent Technologies has announced a new modulation analysis option for its 89600 Series Vector Signal Analysis (VSA) software, aimed at evaluation of 3GPP Long Term Evolution (LTE) wireless systems and their components. Developed for testing and troubleshooting LTE transceivers and components, the option supports analog and digital physical layer (PHY) signal analysis with both uplink and downlink signals. The LTE option makes possible spectrum- analysis and error-vector-magnitude (EVM) measurements for a full frame, within a frame or subframe, and on synchronization and reference channels. It provides a test solution for transmitter measurements on both base stations and mobile stations. The software is designed for use with the firm's PSA Series spectrum analyzers and can achieve EVM performance of -50 dB for a 10-MHz LTE signal. The combination supports LTE bandwidths to 20 MHz with a type 1 FDD frame structure and a wide range of modulation formats, including BPSK, QPSK, 16QAM, and 64QAM.

Agilent Technologies (www.agilent.com)

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