Application Note Explores Modulated Carriers

Complex modulated signals are used throughout modern communications systems. One method of analyzing such signals is through the use of statistical methods, notably probability functions. A free application note from Boonton Electronics (Parsippany, NJ), "Analysis of Complex Modulated Carriers Using Statistical Methods," explains how such functions can be used in conjunction with a digital peak power measurement system to study such complex signals.

The application note includes a simplified view of the example peak power measurement system, along with details on calibration methods for the system. The note also describes how statistical methods are applied at different sampling rates to arrive at a value of how often a specific power level occurs during a measurement. The literature explains these of probability distribution functions (PDFs), cumulative distribution functions (CDFs), and complementary CDFs (CCDFs) and how they can be used for different modulation formats. The six-page application note is available for free download from the company's web site.

Boonton --> http://lists.planetee.com/cgi-bin3/DM/y/eA0JtlqC0Gth0BJTb0Ah

Please or Register to post comments.

Newsletter Signup

Webcasts

GaN Roundtable: The State of GaN Reliability Today

Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.

Click here to register!

Whitepapers

New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
Sponsored by Agilent Technologies
Download this app note

Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies
Download this white paper

Browse more white papers from Microwaves and RF

Connect With Us