Keithley Instruments has just published a free handbook for semiconductor parametric testing, "Parallel Test Technology: The New Paradigm for Parametric Testing." The 60-page handbook provides an overview of the emerging test technique known as parallel parametric testing, an approach for wafer-level parametric testing employing concurrent execution of multiple tests on multiple scribe line structures to maximum test throughput. A copy of the free handbook is available at the link: http://ggcomm.com/Keithley/PPTHandbook.html
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