Keithley Instruments has partnered with the French Mesatronic Group to develop probe cards for semiconductor parametric testing at RF and for low-current DC applications. The new probe cards will work with Keithley parametric testers for simultaneous on-wafer RF and low-level DC testing on any combination of probe pins. The new probe card design will allow higher test throughput since both RF and DC tests can be made with a single wafer insertion. A key to the new probe card is a spatial transformer that interfaces the probe card with a flexible membrane circuit structure in the center of the wafer prober where the probe contact needles are attached. For more on Keithley, visit their web site at
For more on Mesastronic, go to