Software Boosts On-Wafer Test Accuracy

Jan. 31, 2007

The latest version of the WinCal XE measurement software from Cascade Microtech is written to increase the accuracy of on-wafer RF measurements. The new software version includes hybrid calibrations for multiport measurements, handling as many as four ports; local data manipulation for measurement validation and data analysis; and a host of new device characterization tools. The straightforward software supports a wide range of calibration schemes, including eLRRM, SOLT-eLRRM, SOLT-SOLR, and multiline TRL for comparison to NIST-style reference calibration. For more about the software or Cascade's extensive lines of on-wafer probes and measurement systems, visit the company's website at::
http://www.cascademicrotech.com/

About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.