Manual Probe System Positioned for THz Testing (.PDF Download)

Practical semiconductor devices at millimeter-wave frequencies will be needed to enable the realization of the many small cells with high-data-rate capacities for Fifth Generation (5G) wireless communications networks. Part of developing those high-frequency, high-speed devices will be testing them during design and development and then in production. The TS150-THZ manual probe system from MPI Corp. has been designed for on-wafer measurements not just through the entire millimeter-wave frequency range, but at terahertz (THz) frequencies as well.

The TS150-THz manual probe system is designed for benchtop use, with easy access to a device under test, such as a semiconductor wafer. It is well suited for four-port S-parameter measurements with a high-frequency vector network analyzer (VNA). It has a low-profile configuration with a large, rigid platen, providing enough room for large-area micro positioners for maneuvering test probes for measurements from RF through terahertz frequencies.