Testing RF/microwave/millimeter-wave devices under a wide operation range for characterization can be time consuming and error prone. Fortunately, companies are forging software/hardware solutions to aid and even automate this process....More
The task of testing and characterizing RF/microwave/millimeter-wave devices is growing increasingly more complex and time consuming. These new devices need to be characterized so that statistical models can be developed for sophisticated system and circuit design software.
Automating the integrated assembly process can provide many cost and fabrication enhancing benefits. The increased consistency and material efficiency of automation also aids in producing more reliable assemblies.
As the design cycles accelerates, the use and reliance on software tools for modeling and simulation is increasing. Automated testing and manufacturing techniques are also used to meet ever-closer design deadlines....More