USB 3.0 is hitting the mainstream market in a big way in 2012. With native Windows 8 support for USB 3.0 and Intel’s integrated chipset shipping this year, SuperSpeed USB 3.0 adoption rates will really take off...More
View our GaN Roundtable from June 6, 2012, where industry experts debated various claims about gallium nitride. They revealed its true strengths and weaknesses while explaining how this semiconductor material is changing microwave and RF design.
High-performance oscilloscopes are taking the next leap into the future. See how in this webcast from Agilent Technologies. You’ll want to attend if you make high-speed signal integrity measurements or validate leading-edge designs...More
GaN Roundtable: The State of GaN Reliability Today
Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.
New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements Sponsored by Agilent Technologies Download this app note
Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies Download this white paper