Accelerating USB 3.0 Protocol Development

Sponsored by Agilent Technologies

Why this webcast is important:
SuperSpeed USB presents a new set of challenges for design verification and debug of the protocol layer. To take advantage of the new USB SuperSpeed data rate of 5 Gbps, devices must do much more than simply run at a higher data rate. The right tools and debug methods are critical in accelerating products to the market. Learn how to quickly locate problems in today’s complex USB systems.

This webcast will provide an overview of USB protocol design and specific challenges related to SuperSpeed 3.0 design and debug. Also, see how to apply active error insertions with a jammer, thus stress designs to the limits. Whether you are designing host, hub or device, electrical or protocol, Agilent Technologies offers a complete solution.
Who should view this webcast:

  • Device driver developers, Link Layer Debug Engineers, System Integrators, Validation Engineers,Hardware Developers
  • Customers who need to meet challenges to analyze the exact source of USB protocol problems
  • Customers developing a USB host, hub or end device.

Register Now!

Newsletter Signup

Webcasts

GaN Roundtable: The State of GaN Reliability Today

Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.

Click here to register!

Whitepapers

New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
Sponsored by Agilent Technologies
Download this app note

Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies
Download this white paper

Browse more white papers from Microwaves and RF

Connect With Us