DDR memory characterization using a Mixed Signal Oscilloscope

Sponsored by: Agilent Technologies

    Date & Time

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    Event Type

  • On-Demand Webinar

Speakers


Ai-lee Kuan

Technical Program Manager for High-speed Memory Technologies
Agilent Technologies

Description

Why this webcast is important:
A real-time oscilloscope has always been the tool of choice for high-speed memory designers doing DDR electrical or parametric compliance testing and characterization. The limited channels on a real-time oscilloscope prevents the designer from performing DDR protocol trigger and decode to allow for more robust read and write data separation. A mixed signal oscilloscope (MSO) addresses this measurement challenge with 16 additional high-speed digital channels in order to probe DDR command buses. This webcast describes how an MSO performs read and write data separation for full DDR characterization. The webcast will also describe the capabilities of a high performance MSO and probing options that allow a designer to go beyond basic DDR compliance testing.

Who should view this webcast:
Design engineers, test engineers and validation engineers who need to characterize high-speed DDR designs.

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