For those interested in a comparison of the measurement uncertainties between vector network analyzers (VNA) and time domain reflectometers (TDR), W. L. Gore & Associates has prepared a white paper in which they reveal the results of their study. While both instruments are able to analyze time or frequency domain data to accelerate product development cycles, Gore designed an experiment in which to determine if both instruments possess similar levels of measurement precision. The white paper is available for free download from the Gore web site, and Gore representatives will be at booth 731 at IMS 2010 all day to discuss the findings.
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Study Examines VNA And TDR Uncertainties
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Webcasts
GaN Roundtable: The State of GaN Reliability Today
Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.
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Whitepapers
New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
Sponsored by Agilent Technologies
Download this app note
Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies
Download this white paper
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