Choosing Between Virtual and Real Test Gear

Sept. 17, 2009
Complex measurements have created a need for complex test solutions. As a result, more and more test equipment is based on a software-defined-radio (SDR) architecture in which different measurement functions can be programmed in software and a wide range ...

Complex measurements have created a need for complex test solutions. As a result, more and more test equipment is based on a software-defined-radio (SDR) architecture in which different measurement functions can be programmed in software and a wide range of radio standards, for example, can be tested automatically using a single test station. While this approach lacks the simplicity of using test equipment with dedicated controls, it offers tremendous flexibility and the upgradeability required for emerging wireless standards and changing needs in industrial, medical, and military systems.

Of course, the choice of using a "virtual" test system versus one based on dedicated, single-function instruments is very much like choosing to perform measurements on a spectrum analyzer program within a computer rather than using the "real" instrument. Some engineers may prefer having the buttons and knobs in front of them to set center frequency or span, resolution bandwidth, and other measurement parameters, rather than doing the same thing with a computer mouse and display screen. Although both types of measurement solutions are now available, the day may come when the virtual approach replaces dedicated equipment, much in the manner that computers have all but eliminated typewriters.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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