Drive Test System Adds LTE Capability

Feb. 12, 2009
Agilent Technologies has upgraded its drive test platform with the addition of a slew of receiver tests for Long Term Evolution (LTE) cellular systems. The test system and software can be used to quickly verify LTE base station coverage in the field. The ...
Agilent Technologies has upgraded its drive test platform with the addition of a slew of receiver tests for Long Term Evolution (LTE) cellular systems. The test system and software can be used to quickly verify LTE base station coverage in the field. The company plans to display the full measurement solution at the upcoming Mobile World Congress exhibition (Barcelona, Spain,). The hardware and software additions to the system not only support older 2G and 3G systems, but perform a host of LTE measurements, including P-SCH, S-SCH RSSI, and LTE Cell-ID testing. The measurement receiver can tackle as many as eight frequency bands, eliminating the need for band-specific test receivers.

According to Todd Biddle, Vice-President and General Manager of Agilent's Network Solutions Division, "Agilent receivers are an example of our company's general strategy of developing hardware that can be enhanced with software as network technologies evolve. This strategy cuts our customers' capital investments over the long term and, in the case of LTE receiver measurements, it enables current owners of Agilent receivers to integrate LTE testing with tests of existing networks."

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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