Agilent's EM Software Strives For Speed

May 24, 2010
The new release of Electromagnetic Professional (EMPro) 2010 is a "souped-up" version of the 3D EM simulator, designed to provide significant improvements in simulation speed and design efficiency for analyzing EM effects on integrated-circuit (IC) ...

The new release of Electromagnetic Professional (EMPro) 2010 is a "souped-up" version of the 3D EM simulator, designed to provide significant improvements in simulation speed and design efficiency for analyzing EM effects on integrated-circuit (IC) packages, connectors, antennas, and other RF components. The software will be on display at Agilent's booth, No. 924, on the 2010 IMS exhibition floor.

As Marc Petersen, Product Marketing Leader in Agilent's EEsof EDA organization, explains, "EMPro's speed, accuracy, and efficiency improvements go a long way in meeting the needs of today's high-frequency, high-speed device designers. These improvements also provide a significant benefit to users of our Advanced Design System software who are using EMPro within their design flow." Some of the new capabilities include faster finite element method (FEM) simulations through meshing improvements and use of symmetry planes; built-in acceleration of finite difference time domain (FDTD) simulations using graphics processor unit (GPU) hardware; and support for Microsoft Windows 7, Microsoft Windows XP, Microsoft Vista, and Linux operating systems.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

Sponsored Recommendations

Phase Noise Fundamentals: What You Need to Know

Dec. 26, 2024
Gain a deeper understanding of phase noise and its impact on oscillators. This white paper offers a concise technical introduction to phase noise concepts, along with an overview...

Selecting Your Next Oscilloscope: Why Fast Update Rate Matters

Dec. 26, 2024
Selecting your next oscilloscope - A guide from Rohde & Schwarz

Webinar: Fundamentals of EMI Debugging & Precompliance

Dec. 26, 2024
In this webinar our expert will guide you through the fundamentals of EMI debugging & precompliance measurements.

Learn the Fundamentals of Test and Measurement

Dec. 26, 2024
Unlock your measurement potential with Testing Fundamentals from Rohde & Schwarz. Expert resources to help you master measurement basics. Explore now.