National Instruments Tracks Top Test Trends

Jan. 15, 2009
Test-equipment and measurement-software supplier National Instruments has revealed its take on the most significant trends in test and measurement for 2009. The trends include increased adoption of software-defined instrumentation (also known as virtual ...

Test-equipment and measurement-software supplier National Instruments has revealed its take on the most significant trends in test and measurement for 2009. The trends include increased adoption of software-defined instrumentation (also known as virtual instruments), the increased adoption of parallel processing technologies based on the latest multicore microprocessors, increase in the use of system-level tools for field-programmable gate arrays (FPGAs), and the expansion of wireless and protocol-aware testing.

According to Eric Starkloff, Vice-President of Product Marketing for Test and Measurement Products at National Instruments, "The challenging world economy is forcing more companies to look at alternatives to their existing test engineering strategies. More engineers than ever before are turning to software-defined instrumentation and the latest commercial technologies to achieve significant performance and flexibility gains while reducing their overall cost of test." For more details on National Instruments' vision of test and measurement requirements in 2009, visit the firm's web site.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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