Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

Posts by Jack Browne

in Measuring Progress Mar 23, 2017

Beware—the Microwave May be Listening!

The White House's suggestions of surveillance-via-microwave oven may have been dismissed, but is such a thing actually possible?....More
in Measuring Progress Mar 16, 2017

Impedance Tuners Pull Their Loads

Load-pull impedance tuners are useful tools, whether used to find an impedance match for a non-50-Ω DUT or to assess difference impedances on a 50-Ω....More
in Measuring Progress Feb 02, 2017

Probing Those Tiny Millimeter-Wave ICs

ICs are helping electronic design engineers in general to achieve unprecedented levels of miniaturization with multiple-function circuits....More
in Measuring Progress Dec 27, 2016

Fiercely Independent in Making Measurements

Should Microwaves & RF have an independent test lab for evaluating RF/microwave hardware? It sounds like a good idea...at first....More
in Measuring Progress Dec 14, 2016

VNA Test Fixtures Secure Accurate Measurements

Modern commercial vector network analyzers (VNAs) often rely on solid mechanical engineering, in the form of RF/microwave test fixtures....More
in Measuring Progress Dec 08, 2016

Take Temperature While Testing

Taking temperature is a good way to check on health, whether for a patient or a device under test (DUT)....More
in Measuring Progress Oct 20, 2016

Get a Grip on Those MM-Wave Connectors

Coaxial connectors for mm-wave test equipment have extremely fine structures that must be treated gently for optimum performance and operating....More
in Measuring Progress Oct 03, 2016

Practical Ways to Probe for PIM

Constructing an antenna test system involves an educated choice of instruments, subsystems, and shielding materials....More
in Measuring Progress Sep 26, 2016

The Power of 5G on Test Requirements

With 5G on the way, test-equipment designers and suppliers are carrying a heavy load....More
in Measuring Progress Sep 19, 2016

Exploring EDI CON 2016

EDI CON 2016 is a new show—a three-day combination conference and exhibition for RF/microwave engineers....More

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