Read White Paper: Redefining RF and Microwave Instrumentation Through Open Software and Modular Hardware

Sponsored by National Instruments

If you are an engineer making measurements or performing automated tests on electronic devices, you either work with or will work with RF and microwave measurements. When the time comes to add RF to a test system, it may prove significantly more challenging than adding other measurements of the past. Business challenges can quickly sideline the competitiveness of the wireless capability in your latest device due to cost, rapidly changing commercial standards, and single or limited-protocol instrumentation deployment. This creates the need for more openness in software and more modularity in hardware for RF and microwave instrumentation. To meet this need, National Instruments has redefined the traditional approach. Read the white paper to learn more.

Newsletter Signup
Webcasts

True Differential S-Parameter Measurements

Tue, November 5, 2:00pm EST

Sponsored by: Rohde & Schwarz

Click here to register!

Whitepapers

New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
Sponsored by Agilent Technologies
Download this app note

Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies
Download this white paper

Browse more white papers from Microwaves and RF

Connect With Us

Sponsored Introduction Continue on to (or wait seconds) ×