Computer Simulation Technology (CST) has introduced an efficient algorithm in its CST MICROWAVE STUDIO (CST MWS) software that enables sensitivity analysis for several parameters in a single simulation run. CST MWS 2010 features a sensitivity analysis algorithm that is capable of evaluating the S-parameter dependencies on various model parameters after a single three-dimensional (3D) electromagnetic (EM) simulation run. This allows all further evaluations for different model parameter sets to be derived without restarting the full-wave simulation. According to Dr. Martin Timm, Director of Marketing at CST, "The sensitivity of a device's performance to small parameter variations is a key concern in many design processes. Traditional approaches require multiple 3D simulations to derive the various parameter dependencies. CST's new sensitivity analysis gives engineers a fast and efficient means of further minimizing design risk."
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