Correction Software Addresses X-ray Scatter Artifacts in CT Scanning
Nikon Metrology's Scatter Correction CT software is designed to address the challenges posed by X-ray scatter artifacts in industrial computed tomography (CT) scanning. Using advanced physics-based modeling techniques, Scatter Correction CT significantly improves image clarity and measurement accuracy. This is particularly useful for dense materials such as aluminum, steel, ceramic, and Inconel. X-ray scatter artifacts hinder the ability to obtain clear images of internal and external structures, and high-density regions, false inhomogeneities within homogeneous regions, and edge blurring across material boundaries can impact image quality. Scatter Correction CT simulates and corrects the complex interactions occurring within the material, removing the detrimental effects of scatter.
Scatter Correction CT dramatically improves image quality for more precise visualization of internal and external structures, defects, and fine details, with scan times over 100X faster than traditional scatter-free 2D CT methods. Scatter Correction CT is fully compatible with all Nikon CT scanning acquisition modes, and the correction is seamlessly integrated into the scanning workflow, requiring only a single click to enable, reducing the need for specialized skills.
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Nikon Metrology
Scatter Correction CT Software
