Reliability Conference To Convene in Phoenix

Nov. 26, 2006

The IEEE International Reliability Physics Symposium's (IRPS) annual conference returns to Phoenix, AZ next April 15-19, 2007 in the new Phoenix Convention Center. The three-day conference focuses on the study of failure mechanisms for microelectronic and nanoelectronic devices. The technical program chair is Dr. Ronald Lacoe of The Aerospace Corporation, currently serving as a member of the firm's technical staff and senior scientist in the Microelectronics Technology Department. Last year's conference drew more than 650 industry professionals in search of higher component reliability. For more information on the conference, visit the IRPS website at: www.irps.org/

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.