On the other hand, the relative dielectric constant of the epoxy-glass substrate was found to be dependent upon frequency. Figure 4 shows the variation of er with frequency for this type of substrate. It was also found that losses in the epoxy-glass board make it impractical for applications above 500 MHz.
As a conclusion, this simplified method can be readily used to determine the relative dielectric constant of a microstrip substrate using a variety of different substrate materials. The approach is based on measuring the input reactance of an open-circuit microstrip line with the aid of a vector network analyzer (VNA) at a specified frequency. The classic microstrip-line equations found in the literature were formulated as a root finder algorithm to search for er.
REFERENCES
1. G. Gonzalez, Microwave Transistor Amplifiers Analysis and Design, 2nd ed., Prentice-Hall, Upper Saddle River, NJ, 1997, Chapter 2.
2. I.J. Bahl and D.K. Trivedi, "A Designer's Guide to Microstrip Line" MicroWaves, May 1977, pp.174-182.