Study Examines VNA And TDR Uncertainties

May 27, 2010

For those interested in a comparison of the measurement uncertainties between vector network analyzers (VNA) and time domain reflectometers (TDR), W. L. Gore & Associates has prepared a white paper in which they reveal the results of their study. While both instruments are able to analyze time or frequency domain data to accelerate product development cycles, Gore designed an experiment in which to determine if both instruments possess similar levels of measurement precision. The white paper is available for free download from the Gore web site, and Gore representatives will be at booth 731 at IMS 2010 all day to discuss the findings.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.