Agilent Adds Source-Corrected NF Measurements

Sept. 13, 2007
Agilent Technologies has announced the availability of source-corrected noise-figure (NF) measurement capability for its PNA-X vector network analyzer (VNA). By using the company's ECal electronic calibration module as an impedance tuner, the VNA can ...

Agilent Technologies has announced the availability of source-corrected noise-figure (NF) measurement capability for its PNA-X vector network analyzer (VNA). By using the company's ECal electronic calibration module as an impedance tuner, the VNA can make vector-error- corrected noise-figure measurements based on the highly accurate cold-source technique. The ECal module helps the analyzer find the optimum source impedance for noise measurements on a device under test, such as a low-noise amplifier (LNA), at frequencies from 10 MHz to 26.5 GHz. It also enables measurements with a single connection, saving measuring time and wear on test connectors. The error-corrected approach features fast measurement time of 42 ms/point and surpasses the accuracy provided by Y-factor-based NF analyzers or spectrum analyzers used for NF measurements. The PNA-X can also be specified with an integrated second source, signal combining network, and internal pulse generators for a variety of measurements on amplifiers and frequency-translation devices.

Agilent Technologies (www.agilent.com)

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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