Keithley Offers 2006 Measurement Catalog

Jan. 9, 2006

Keithley Instruments has announced the availability of its 2006 Test and Measurement Catlog. It features information on the company's RF/microwave products as well as on semiconductor test, DC test, data-acquisition, and optoelectronic test equipment. The catalog is conveniently arranged by major product type and application area. Each section contains a tutorial on test-system design and use with practical tips to help users avoid common measurement errors, increase productivity, and lower their cost of testing. To request a free copy, visit the Keithley web site at www.keithley.com/pr/025.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.