EMI Test Receiver Includes FFT Capabilities

Aug. 25, 2006
Rohde & Schwarz recently introduced the ESU family of CISPR16-1-1 compliant electromagnetic-interference (EMI) receivers with Fast Fourier Transform (FFT) time-domain scan capabilities. While traditional EMI measurements are time and labor intensive, the ...

Rohde & Schwarz recently introduced the ESU family of CISPR16-1-1 compliant electromagnetic-interference (EMI) receivers with Fast Fourier Transform (FFT) time-domain scan capabilities. While traditional EMI measurements are time and labor intensive, the FFT capabilities in the ESU test receivers allows them to measure an EMI spectrum with a tremendous speed advantage over traditional spectrum-analyzer-based EMI receivers, increasing measurement speed by 10 to 100 times. The FFT capability is not meant to replace normal spectrum analysis measurement functions but to provide a quicker overview of an EMI spectrum profile. The ESU instruments also include full spectrum analyzer capabilities in three models operating over the ranges of 20 Hz to 8 GHz, 20 Hz to 26.5 GHz, and 20 Hz to 40 GHz. The analyzers feature a wide range of detectors, including CISPR average and RMS detectors, for making EMI measurements. For more information on the ESU EMI test receivers, visit the Rohde & Schwarz web site at the link below:

www.rohde-schwarz.com

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

Sponsored Recommendations

Phase Noise Fundamentals: What You Need to Know

Dec. 26, 2024
Gain a deeper understanding of phase noise and its impact on oscillators. This white paper offers a concise technical introduction to phase noise concepts, along with an overview...

Selecting Your Next Oscilloscope: Why Fast Update Rate Matters

Dec. 26, 2024
Selecting your next oscilloscope - A guide from Rohde & Schwarz

Webinar: Fundamentals of EMI Debugging & Precompliance

Dec. 26, 2024
In this webinar our expert will guide you through the fundamentals of EMI debugging & precompliance measurements.

Learn the Fundamentals of Test and Measurement

Dec. 26, 2024
Unlock your measurement potential with Testing Fundamentals from Rohde & Schwarz. Expert resources to help you master measurement basics. Explore now.