NI Offers Virtual Instrumentation Conferences

Sept. 29, 2004
National Instruments (Austin, TX) today announced open registration for the 2004-2005 NIDays worldwide conference and NI Technical Symposium. The company's annual series of virtual instrumentation conferences reach 42 countries and 91 cities. The ...

National Instruments (Austin, TX) today announced open registration for the 2004-2005 NIDays worldwide conference and NI Technical Symposium. The company's annual series of virtual instrumentation conferences reach 42 countries and 91 cities. The on-line conferences offer new product presentations, hands-on technical sessions and exhibits on the latest solutions for test, measurement and control applications. The firm estimates that about 10,000 engineers, developers, educators and National Instruments' Alliance Partner Program members will attend the conferences across Europe, Latin America, and the Asia-Pacific area. Attendees will have the opportunity to exchange ideas on innovative approaches to technical challenges, study future technology trends in virtual instrumentation and learn firsthand how the company's software and hardware can save them time and money. Attendees can also learn about the next generation of multifunction data acquisition devices. For more information and a complete listing of all NI Days and NI Technical Symposium events, visit the company's web site.

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About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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