Millimeter-wave frequencies are finding more applications with time, from automotive electronics to emerging Fifth Generation (5G) wireless communications systems. To performance measurements at higher frequencies, visitors to the National Instruments’ booth at EDI CON 2016 had a chance to demonstrate a test system solution for a millimeter-wave IEEE 802.11ad WiGig radio.
The high-frequency test system provides the accuracy and speed needed by chipset developers working on millimeter-wave radios for the next generation of communications equipment. For example, Anand Iyer, Director of Millimeter-Wave Product Marketing at Broadcom Limited, noted: “NI’s developments in millimeter-wave test solutions have allowed us to address various testing challenges like reducing test costs and providing high-volume manufacturing and over-the-air test capabilities.” The test system features the flexibility to add capability as needed, using slide-in PXI modules for signal generation and analysis, in a rack-mount instrument chassis.
Demonstrations of the WiGig test system were available at EDI CON booth #313.
About the Author
Jack Browne
Technical Contributor
Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.