GaN Transistors Power Satcom, Radar

June 14, 2012
A new family of X-band power transistors from Cree, based on GaN high-electron-mobility-transistor (HEMT) technology, promises to provide new levels of RF/microwave power density in radar and satellite-communications (satcom) systems. On display at the ...

A new family of X-band power transistors from Cree, based on GaN high-electron-mobility-transistor (HEMT) technology, promises to provide new levels of RF/microwave power density in radar and satellite-communications (satcom) systems. On display at the 2012 IMS, these are impedance-matched 50- and 100-W GaN power transistors, one of each for satcom and commercial radar applications. Models CGHV96050F1 and CGHV96100F1 are intended for satcom use, delivering 50 and 100 W linear output power, respectively, from 7.9 to 8.4 GHz. Models CGHV96050F2 and CGHV96100F2 are designed for pulsed output power levels (with a 100-microsecond pulse at 10% duty cycle) of 50 and 100 W, respectively from 8.4 to 9.6 GHz. According to Jim Milligan, Cree's Director of RF and Microwave, "The new Cree X-Band GaN HEMT product family represents disruptive technology that we believe will set new standards of efficiency and performance for high-frequency, high-power applications such as satellite communications and X-band commercial radar. The performance advantages of higher power ratings, higher linear efficiency, and higher gain, combined with a reduced footprint, offer dramatic advantages when compared to GaAs MESFET transistors or TWT amplifiers. "We believe this new product family will deliver comprehensive system benefits, including superior thermal management and significantly-reduced power supply loads," he continues. "The new product family also offers a lower cost alternative to TWT amplifiers and associated high-voltage power supplies and linearization systems while improving overall system reliability." For more details on these high-power GaN impedance-matched (to 50Ω) transistors, visit Cree booth No. 2125.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

Sponsored Recommendations

Phase Noise Fundamentals: What You Need to Know

Dec. 26, 2024
Gain a deeper understanding of phase noise and its impact on oscillators. This white paper offers a concise technical introduction to phase noise concepts, along with an overview...

Selecting Your Next Oscilloscope: Why Fast Update Rate Matters

Dec. 26, 2024
Selecting your next oscilloscope - A guide from Rohde & Schwarz

Webinar: Fundamentals of EMI Debugging & Precompliance

Dec. 26, 2024
In this webinar our expert will guide you through the fundamentals of EMI debugging & precompliance measurements.

Learn the Fundamentals of Test and Measurement

Dec. 26, 2024
Unlock your measurement potential with Testing Fundamentals from Rohde & Schwarz. Expert resources to help you master measurement basics. Explore now.