0922 Mw Mercury Rugged Data Storage System Promo 6311f35129505

Mercury’s Data Recorder Eases Access to Big Data at the Edge

Sept. 2, 2022

A data-center-class, all-flash-memory, network-attached storage system serves mission-critical AI and machine-learning applications.

David Maliniak

Related To: Microwaves & RF

The Overview

For mission-critical aerospace, defense, and commercial edge applications, Mercury Systems’ Rugged Data Storage (RDS) system is designed for low latency, scalability, and security. The system provides enterprise storage with a universal, single-tier flash cloud for all types of data. It eliminates bottlenecks and complex storage tiering traditionally done with hard-disk drives and other media.

Who Needs It & Why?

The proliferation of sensors like radar and image capture have resulted in an explosion of data that's difficult to store, access, or analyze in real-time on conventional hard-disk or flash drives. RDS’s universal data-storage approach enables fast, secure access to big data and AI and machine-learning-powered exploitation at the edge, so users can make critical decisions quickly.

RDS relies on commercial flash technology coupled with unique software algorithms from VAST Data Federal to extend write endurance to 10+ years, as well as reduce disk space requirements via innovative data reduction and compression capabilities that lower total cost of ownership. Optimized for size, weight, and power-constrained rugged environments such as aircraft, ships, ground radar stations, and industrial applications, Mercury’s RDS system improves performance, ease of serviceability, and data protection at the edge.

Under the Hood

Mercury’s RDS puts scalable, multi-petabyte, all-flash data storage next to the data source for edge-based, real-time applications like advanced threat detection and sensor fusion. It deploys a universal, single-tier flash cloud for all types of data with high-speed NVM Express (NVMe) performance to eliminate bottlenecks and complex storage tiering. Other features include:

Data-processing-unit (DPU) network acceleration, storage-class memory, affordable hyperscale flash technology, and VAST Data software algorithms for fast access to big data, AI, and ML insights over high-speed Ethernet.
More short-depth storage boxes (D-BOX), compute boxes (C-BOX), and/or network switch boxes can infinitely scale performance or storage capacity.
MIL-STD-810 ruggedization and integrated FIPS 140-2 security.

About the Author

David Maliniak | Executive Editor, Microwaves & RF

I am Executive Editor of Microwaves & RF, an all-digital publication that broadly covers all aspects of wireless communications. More particularly, we're keeping a close eye on technologies in the consumer-oriented 5G, 6G, IoT, M2M, and V2X markets, in which much of the wireless market's growth will occur in this decade and beyond. I work with a great team of editors to provide engineers, developers, and technical managers with interesting and useful articles and videos on a regular basis. Check out our free newsletters to see the latest content.

You can send press releases for new products for possible coverage on the website. I am also interested in receiving contributed articles for publishing on our website. Use our contributor's packet, in which you'll find an article template and lots more useful information on how to properly prepare content for us, and send to me along with a signed release form.

About me:

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy, leaving to rejoin the EOEM B2B publishing world in January 2020. David earned a B.A. in journalism at New York University.