Researchers and developers of mid-wave infrared (MWIR) lasers have been on the hunt for an optical spectrum analyzer to quickly and precisely analyze the wavelength spectrum of lasers, especially in the 5-μm band. Addressing this need, Yokogawa Test & Measurement recently released the AQ6377E optical spectrum analyzer for mid-wave infrared (MWIR) measurements.
Building on the optical performance of the preceding AQ6377 model, the AQ6377E provides additional features and functions to enhance speed, accuracy, and capability to meet a broader range of demanding laser applications, such as environmental measurement.
The AQ6377E, which performs pulsed-light measurements under various conditions, can evaluate side-mode suppression ratio (SMSR), thus avoiding having to use Fourier transform optical spectrum analyzer (FT-OSA) instruments.
As the successor to the AQ6377, the AQ6377E optical spectrum analyzer offers a number of new functions and specifications, such as improved performance of the built-in chopper, which operates automatically according to the measurement sensitivity setting. The NORMAL/CHOP and MID/CHOP measurement sensitivity settings apply the lock-in detection function to the intermediate NORMAL and MID sensitivities of the previous model. This reduces the impact of background noise when measuring MWIR light spectra, and it enables faster and more accurate measurements.
The AQ6377E can make much wider pulsed-light measurements due to the addition of a new function: advanced pulsed light measurement mode. It improves the ability to measure pulsed light with low-repetition frequencies, something not possible with the previous model. In laser evaluation, simultaneous measurement over a wide level range is better than the previous AQ6377 as well.
The new AQ6377E also offers a dynamic measurement range for the simultaneous measurement of a laser’s optical spectrum. It ensures accurate evaluation of the SMSR, an index of laser performance, which is difficult to achieve with an FT-OSA.
