What you'll learn:
- How the rise in AI-dedicated data centers are increasing the demand for optical modules and devices.
- How testing optical devices, optical modules, and other optical components require faster, smaller, and higher-performance OSAs.
- How the AQ6361 optical spectrum analyzer addresses meets these production needs.
The widespread adoption of machine learning has had a dramatic impact on society, leading to a rapid increase in the creation of AI-dedicated data centers that need to process large amounts of data at high speeds. This, in turn, is driving a surge in the demand for optical modules and devices for high-speed data transfer. Those producing optical devices, optical modules, and other optical components demand faster, smaller, and higher-performance test solutions to meet this escalating demand.
Addressing this issue, Yokogawa Test & Measurement recently released the AQ6361 optical spectrum analyzer (OSA). It's designed predominantly to perform production testing of datacom and telecom components like laser diodes, optical transceivers, and optical amplifiers.
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The compact AQ6361 offers up to 20X the measurement speed of legacy devices, meeting production needs with fast measurements and excellent optical performance. It also satisfies demands for a solution that doesn't compromise on quality and reliability, significantly reducing the production test time for optical devices.
Approximately half the size of legacy solutions, the AQ6361 brandishes a space-saving design that's also suitable for integration into laser diode chip testers and other evaluation systems. It offers a wavelength resolution of 0.03 nm and a wavelength range of 1,200 to 1,700 nm, providing high dynamic range measurements with 73 dB of stray light suppression, making it adaptable for various optical module testing.
