170-GHz/220-GHz Broadband VNA Built for On-Wafer Characterization
This article is part of TechXchange: 5G Test and Measurement
The Overview
Keysight Technologies has teamed with FormFactor, Dominion MicroProbes (DMPI), and Virginia Diodes to create a 170-GHz/220-GHz broadband vector-network-analysis (VNA) package that shortens design and verification cycles for 5G and emerging 6G applications.
Who Needs It & Why?
This jointly developed VNA solution performs on-wafer characterization of mmWave components under various conditions and is said to offer advanced dynamic range, high output power, and maximum stability. With it, designers can efficiently characterize on-wafer devices and circuits, enabling the creation of highly accurate process design kits (PDKs) used to design IC models that shorten the design and verification cycle. It also enables rapid deployment of devices for the emerging 5G and 6G MMICs.
Under the Hood
The fully integrated solution comprises:
- Keysight's N5291A 125-GHz broadband VNA, a single-sweep instrument with compact frequency extenders that delivers accurate leveled power.
- DMPI/FormFactor T-Wave GSG Dual band probes, which provide wafer-level electrical measurement on FormFactor wafer-probing solutions of millimeter-wave (mmWave) devices and materials up to 1.1 THz.
- VDI's specially designed sub-THz frequency extenders, which enable Keysight's N5291A VNAs to perform highly accurate measurement of on-wafer devices under test from 900 Hz to 170 GHz or 220 GHz in a single, continuous frequency sweep.
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